Title :
An interactive environment for the transparent logic simulation and testing of integrated circuits
Author :
Castrodale, Grant L. ; Dollas, Apostolos ; Krakow, William T.
Author_Institution :
Dept. of Electr. Eng., Duke Univ., Durham, NC, USA
Abstract :
An interactive environment utilizing a knowledge-based system for the transparent testing of integrated circuits from simulation data has been developed. Unique features of this system are its modularity and its ease of expansion with new simulators and testers. The system uses the Omnitest language and a tester description language. The environment is fully operational and has been used to test several fabricated integrated circuits. An example illustrating the operation of the system is presented
Keywords :
VLSI; automatic testing; high level languages; integrated circuit testing; interactive systems; knowledge based systems; logic CAD; logic testing; IC testing; Omnitest language; VLSI; interactive environment; knowledge-based system; modularity; pin map format; tester description language; testing of integrated circuits; transparent logic simulation; Automatic testing; Circuit simulation; Circuit testing; Environmental economics; Integrated circuit testing; Logic circuits; Logic testing; Performance evaluation; System testing; Very large scale integration;
Conference_Titel :
Test Conference, 1990. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-9064-X
DOI :
10.1109/TEST.1990.114047
