Title :
Direct access test scheme-design of block and core cells for embedded ASICs
Author :
Immaneni, Venkata ; Raman, Srinivas
Author_Institution :
Intel Corp., Chandler, AZ, USA
Abstract :
Intel requires the use of a direct-access test scheme in embedded-core or block-based ASIC (application-specific integrated-circuit) designs. This scheme provides for separate testing of individual block or core cells using proven test vectors. The authors discuss the design modifications for block cells with low pin counts, user application blocks, and large cores with high pin counts. The implementation and verification of the direct-access test scheme in a block- or core-based embedded ASIC design are also briefly described
Keywords :
application specific integrated circuits; automatic testing; integrated circuit testing; logic CAD; logic testing; IC testing; Intel; VLSI; application-specific integrated-circuit; block cells; block-based ASIC; core cells; direct-access test; embedded ASICs; logic testing; test vectors; user application blocks; Application specific integrated circuits; Circuit testing; Flexible printed circuits; Integrated circuit interconnections; Integrated circuit packaging; Integrated circuit testing; Logic circuits; Logic testing; Pins; System testing;
Conference_Titel :
Test Conference, 1990. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-9064-X
DOI :
10.1109/TEST.1990.114058
