An advanced test system architecture for synchronous and asynchronous control of mixed signal device testing

Author

Kurita, J. ; Kasuga, Nobuyuki ; Hiwada, Kiyoyasu

Author_Institution

Yokogawa-Hewlett-Packard Ltd., Tokyo, Japan

fYear

1990

fDate

10-14 Sep 1990

Firstpage

508

Lastpage

513

Abstract

The authors present a tester capable of generating and measuring real-time-managed mixed signals by means of a dual master clock and master/slave multi-sequencing. This tester can test devices under conditions very close to their real working environment. The tester thus readily enhances testing reliability and improves testing throughput promptly. A powerful software package, combined with a library-oriented application environment, eases the job of developing tests for mixed-signal devices

Keywords

application specific integrated circuits; automatic test equipment; automatic testing; computer architecture; electronic equipment testing; ATE; asynchronous control; dual master clock; library-oriented application environment; master/slave multi-sequencing; mixed signal device testing; real-time-managed mixed signals; reliability; software package; synchronous control; testing throughput; Circuit testing; Clocks; Control systems; Frequency measurement; Frequency synchronization; Master-slave; Signal generators; Signal processing; System testing; Test pattern generators;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1990. Proceedings., International

Conference_Location

Washington, DC

Print_ISBN

0-8186-9064-X

Type

conf

DOI

10.1109/TEST.1990.114061

Filename

114061