DocumentCode
2723547
Title
AC-drive enhanced relaxor characteristics and domain breakdown in ferroelectrics containing quenched impurities
Author
Tan, Qi ; Viehland, Dwight
Author_Institution
Dept. of Mater. Sci. & Eng., Illinois Univ., Urbana, IL, USA
Volume
2
fYear
1996
fDate
18-21 Aug 1996
Firstpage
975
Abstract
The dielectric constant has been measured for various compositions in the (Pb1-3/2yLay) (Zr0.65Ti0.35 )O3 solution as a function of AC drive amplitude. These studies have shown the presence of strong nonlinearities and enhanced relaxor characteristics with increasing AC drive. Corresponding transmission electron microscopy investigations demonstrated an enhanced breakdown of ferroelectric domains. Polarization studies revealed linearity in the range of field strengths investigated, demonstrating that the dielectric nonlinearities are not due to polarization switching, but rather to the dynamics of various domain-like states. In the disordered condition, evidence is then presented which demonstrates a mesoscale freeze out of polar clusters
Keywords
dielectric polarisation; electric domains; ferroelectric materials; impurities; lanthanum compounds; lead compounds; permittivity; piezoceramics; transmission electron microscopy; (Pb1-3/2yLay) (Zr0.65Ti0.35 )O3 solution; AC drive amplitude; AC-drive enhanced relaxor characteristics; PLZT; PbLaZrO3TiO3; compositions; dielectric constant; dielectric nonlinearities; disordered condition; domain breakdown; domain-like states; ferroelectric domains; ferroelectrics; field strengths; linearity; mesoscale freeze out; polar clusters; polarization studies; quenched impurities; strong nonlinearities; transmission electron microscopy; Dielectric constant; Dielectric measurements; Electric breakdown; Ferroelectric materials; Impurities; Materials science and technology; Polarization; Relaxor ferroelectrics; Temperature; Transmission electron microscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Applications of Ferroelectrics, 1996. ISAF '96., Proceedings of the Tenth IEEE International Symposium on
Conference_Location
East Brunswick, NJ
Print_ISBN
0-7803-3355-1
Type
conf
DOI
10.1109/ISAF.1996.598191
Filename
598191
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