DocumentCode
2723574
Title
A study of faulty signatures using a matrix formulation
Author
Chan, John C. ; Abraham, Jacob A.
Author_Institution
IBM Corp., Austin, TX, USA
fYear
1990
fDate
10-14 Sep 1990
Firstpage
553
Lastpage
561
Abstract
The authors describe a novel matric method of analyzing faulty signatures from both single-input and multiple-input signature registers (MISRs). In particular, the information contained in the faulty signature of an MISR is investigated. The results indicate that the proposed method can be used to locate the faulty cycle or channel(s) of the failing net. The formulation has the advantage of simplicity over the polynomial representation and can be used to determine the relation between an error and its syndrome. The results provide new insights into the application of MISRs to built-in self-test
Keywords
automatic testing; built-in self test; logic testing; matrix algebra; built-in self-test; error; faulty cycle; faulty signatures; matrix formulation; multiple-input signature registers; single-input signature register; Automatic testing; Error correction; Fault diagnosis; Feedback; Jacobian matrices; Polynomials; Registers;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1990. Proceedings., International
Conference_Location
Washington, DC
Print_ISBN
0-8186-9064-X
Type
conf
DOI
10.1109/TEST.1990.114067
Filename
114067
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