DocumentCode
2723649
Title
A new approach to mixed-signal diagnosis
Author
Rastogi, Ravi ; Sierzega, Ken
Author_Institution
Cimflex Teknowledge Corp., Pittsburgh, PA, USA
fYear
1990
fDate
10-14 Sep 1990
Firstpage
591
Lastpage
597
Abstract
The authors present a unique approach to diagnosing mixed-signal circuits down to the failing component or node. This approach uses an innovative artificial intelligence technique called model-based reasoning. Previous attempts to automate mixed-signal diagnosis have used component reliability data, node voltage comparisons, or fault dictionaries. Systems built on these approaches are inaccurate, slow, and very costly to develop and maintain. In contrast, the model-based reasoning approach is based on a thorough understanding of the electronic behavior of circuit components. A model-based system that requires minimal setup time and accurately diagnoses mixed-signal circuits has been built. It is concluded that model-based diagnosis resolves traditionally hard diagnostic problems, including feedback loops, unavailability of current measurements, and infinite symptom-fault relationships. Model-based diagnostic systems are easily configured for new circuits and can be easily integrated with external instrumentation and testers
Keywords
application specific integrated circuits; artificial intelligence; automatic testing; electronic engineering computing; knowledge based systems; ASIC; KCL models; artificial intelligence; electronic behavior; mixed-signal diagnosis; model-based reasoning; troubleshooting; Artificial intelligence; Circuit faults; Circuit testing; Current measurement; Dictionaries; Fault diagnosis; Feedback loop; Inference mechanisms; Maintenance; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1990. Proceedings., International
Conference_Location
Washington, DC
Print_ISBN
0-8186-9064-X
Type
conf
DOI
10.1109/TEST.1990.114072
Filename
114072
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