A fourth generation analog incircuit program generator

Author

Crook, David T.

Author_Institution

Hewlett-Packard Co., Loveland, CO, USA

fYear

1990

fDate

10-14 Sep 1990

Firstpage

605

Lastpage

612

Abstract

A fourth-generation analog in-circuit program generator (APG) is described. A custom hybrid behavioral/nodal simulator using Monte Carlo statistical analysis is shown to provide high-quality tests that require a minimum of debug and long-term maintenance while maximizing test portability. After over a year of use, this APG has shown, on many occasions, to give analog turn-on rates of 98% to 100%. This is a significant improvement over previous generations. This high turn-on has reduced the amount of debug and maintenance time significantly. The validity of the model was demonstrated when its results were major input in setting the tester specifications. Those results were confirmed by extensive environmental and performance verification. The need for accurate test limits for analog in-circuit tests is shown

Keywords

Monte Carlo methods; analogue circuits; automatic programming; automatic testing; electronic equipment testing; environmental testing; performance evaluation; statistical analysis; Monte Carlo statistical analysis; custom hybrid behavioral/nodal simulator; environmental testing; fourth generation analog incircuit program generator; long-term maintenance; performance verification; test portability; Analytical models; Automatic programming; Impedance; Manufacturing; Monte Carlo methods; Nails; RLC circuits; System testing; Voltage; Wire;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1990. Proceedings., International

Conference_Location

Washington, DC

Print_ISBN

0-8186-9064-X

Type

conf

DOI

10.1109/TEST.1990.114074

Filename

114074