DocumentCode :
2723676
Title :
Conductive adhesives for high-frequency applications
Author :
Sihlbom, Rolf ; Dernevik, Markus ; Lai, Zonghe ; Starski, Piotr ; Liu, Johan
Author_Institution :
IVF, Molndal, Sweden
fYear :
1997
fDate :
26-30 Oct 1997
Firstpage :
123
Lastpage :
130
Abstract :
In this paper, we present results from measurement and simulation of epoxy-based anisotropically conductive adhesive joints (ACA). We studied two different types of connection: flip-chip bonded Si test chip and a transmission line gap bridged by Cu foil. Test chips were mounted on three substrates: rigid FR-4 PCB, flexible PCB and high frequency teflon-based duroid substrate. Equivalent electrical models are discussed based on physical considerations and parameters were fitted to measurement data in the HP MDS high-frequency CAD tool. A HP8510 network analyser was used to measure S-parameters on rigid FR-4 and flex boards in the 500 MHz-8 GHz frequency range for both flip-chips and bridges, and for duroid mounted flip-chips and bridges over 1-30 GHz. ACA microstructures were studied by cross-sectioning and SEM. LF results for 500 MHz-8 GHz indicated that ACA flip-chip joints and bridge joints on FR-4 or flex can be used. For HF applications (1-30 GHz), ACA flip-chip joints and bridge joints on duroid can be used. For flip-chip joints and bridge joints, ACA was as good as or better than the solder joint for FR-4 over 45 MHz-2 GHz and for duroid substrates over 1-30 GHz. The largest contribution to transmission loss is due to Si chip resistivity in the flip-chip assembly. HP momentum analysis showed that for duroid, Si-chip crosstalk also gave power losses, which is not the case for FR-4 or flex. HP momentum analysis of flip-chip on FR-4 and flex showed that FR-4 and flex substrate losses also should be considered. Different ACA particle sizes and materials made little difference to ACA joint electrical behaviour
Keywords :
UHF circuits; adhesion; circuit CAD; circuit analysis computing; circuit testing; conducting polymers; crosstalk; electrical resistivity; filled polymers; flip-chip devices; integrated circuit packaging; losses; microwave circuits; particle size; scanning electron microscopy; 1 to 30 GHz; 500 MHz to 8 GHz; ACA bridge joints; ACA flip-chip joints; ACA joint electrical behaviour; ACA materials; ACA microstructures; ACA particle size; Cu; Cu foil transmission line gap bridge; FR-4 substrate losses; HP MDS high-frequency CAD tool; HP momentum analysis; HP8510 network analyser; S-parameters; SEM; Si; Si chip resistivity; Si-chip crosstalk; conductive adhesives; cross-sectioning; duroid mounted flip-chips; epoxy-based anisotropically conductive adhesive joints; equivalent electrical models; flex substrate losses; flexible PCB substrate; flip-chip assembly; flip-chip bonded Si test chip; flip-chips; high frequency teflon-based duroid substrate; high-frequency applications; parameter fitting; power losses; rigid FR-4 PCB substrate; solder joint; transmission loss; Anisotropic magnetoresistance; Bonding; Bridges; Conductive adhesives; Conductivity measurement; Frequency; Power transmission lines; Semiconductor device measurement; Testing; Transmission line measurements;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Polymeric Electronics Packaging, 1997. Proceedings., The First IEEE International Symposium on
Conference_Location :
Norrkoping
Print_ISBN :
0-7803-3865-0
Type :
conf
DOI :
10.1109/PEP.1997.656482
Filename :
656482
Link To Document :
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