Title :
Design of signature circuits based on weight distributions of error-correcting codes
Author :
Iwasaki, Kazuhiko ; Yamaguchi, Noboru
Author_Institution :
Hitachi Ltd., Tokyo, Japan
Abstract :
Design techniques that can improve the aliasing probabilities of signature circuits for VLSI BIST (built-in self-test) are presented. The proposed techniques are based on the binary weight distributions of error-correcting codes over GF(2) and GF(2m). The technique considered for calculating the aliasing probability of signature circuits is appropriate for a vector supercomputer. Some of the calculations were done using the S810 supercomputer. The vectorization ratio of the program was 99.885% for an MISR (multiple-input signature register) with 16 inputs and for test length n=100-105
Keywords :
VLSI; built-in self test; error correction codes; logic CAD; logic testing; probability; shift registers; Hitachi; S810 supercomputer; VLSI BIST; aliasing probabilities; error-correcting codes; multiple-input signature register; signature circuits; vector supercomputer; vectorization ratio; weight distributions; Automatic testing; Built-in self-test; Circuit testing; Error correction codes; Laboratories; Polynomials; Probability; Supercomputers; Vectors; Very large scale integration;
Conference_Titel :
Test Conference, 1990. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-9064-X
DOI :
10.1109/TEST.1990.114095