Title :
A charge pump current missmatch calibration technique for ΔΣ fractional-N PLLs in 0.18-μm CMOS
Author :
Chiu, Wei-Hao ; Chang, Tai-Shun ; Lin, Tsung-Hsien
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Abstract :
This work presents a charge pump (CP) calibration technique for a delta-sigma fractional-N phase-locked loop (ΣΔ-FNPLL). The proposed calibration method introduces an auxiliary path to the CP circuit and utilizes some interval within each reference cycle to detect the mismatch and then correct the up/down current difference. The proposed CP calibration is employed in the design of a 2.4-GHz ΣΔ-FNPLL. The experimental result has demonstrated that the in-band phase noise and fractional spurs are significantly reduced when the proposed CP calibration is activated. Fabricated in a TSMC 0.18-μm CMOS process, the whole ΣΔ-FNPLL consumes 23 mW from a 1.8-V supply.
Keywords :
CMOS integrated circuits; charge pump circuits; delta-sigma modulation; phase locked loops; phase noise; ΣΔ fractional-N PLL; CMOS; CP circuit; TSMC CMOS process; charge pump current missmatch calibration; delta-sigma fractional-N phase-locked loop; fractional spurs; frequency 2.4 GHz; in-band phase noise; power 23 mW; reference cycle; size 0.18 μm; up-down current difference; voltage 1.8 V; 1f noise; Calibration; Charge pumps; Circuits; Current measurement; Degradation; Noise shaping; Phase frequency detector; Phase locked loops; Phase measurement;
Conference_Titel :
Solid-State Circuits Conference, 2009. A-SSCC 2009. IEEE Asian
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-4433-5
Electronic_ISBN :
978-1-4244-4434-2
DOI :
10.1109/ASSCC.2009.5357182