DocumentCode :
2724037
Title :
Novel clamp circuits for IC power supply protection
Author :
Maloney, Timothy J. ; Dabral, Sanjay
Author_Institution :
Intel Corp., Santa Clara, CA, USA
fYear :
1995
fDate :
12-14 Sept. 1995
Firstpage :
1
Lastpage :
12
Abstract :
Biased and terminated p-n-p transistor chains are made from floating n-wells in p-substrate CMOS and used for power supply ESD clamps. The p-n-p gain may allow a compact termination circuit to be used, resulting in a stand-alone clamp. Bipolar p-n-p action accounts for unwanted low-voltage conduction as well as for very desirable clamping of power supply overvoltages. Bias networks are used to prevent excessive leakage at high temperature. These devices are becoming crucial to success in ESD product testing of CMOS integrated circuits.
Keywords :
CMOS integrated circuits; electrostatic discharge; leakage currents; overvoltage protection; power supply circuits; protection; reference circuits; CMOS integrated circuits; IC power supply protection; biased transistor chains; clamp circuits; floating n-wells; p-substrate CMOS; power supply ESD clamps; power supply overvoltages; terminated p-n-p transistor chains; CMOS integrated circuits; Circuit testing; Clamps; Electrostatic discharge; Integrated circuit testing; Power supplies; Protection; Surges; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 1995
Conference_Location :
Phoenix, AZ, USA
Print_ISBN :
1-878303-59-7
Type :
conf
DOI :
10.1109/EOSESD.1995.478262
Filename :
478262
Link To Document :
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