• DocumentCode
    2724114
  • Title

    Silicon-based system in packaging for light emitting diodes

  • Author

    Bin Cao ; Shan Yu ; Huai Zheng ; Sheng Liu

  • Author_Institution
    Wuhan Nat. Lab. for Optoelectron., Huazhong Univ. of Sci. & Technol., Wuhan, China
  • fYear
    2012
  • fDate
    May 29 2012-June 1 2012
  • Firstpage
    1267
  • Lastpage
    1271
  • Abstract
    Silicon-based packaging for light emitting diodes (LEDs) is the tendency of packaging for improving high-power LED performance. In this paper, a simple and high efficient wafer level packaging (WLP) based on silicon with TSV is proposed. Monte-Carlo ray-trace method is implemented to analyze the effect of the size of silicone lens on light extraction efficiency (LEE). The results show that LEE of hemisphere lens is higher than that of spherical segment lens. LEE increases with radius increasing and becomes stable when radius is above 1.2 mm due to the absorption of silicon for small part of light reflected back. Temperature distribution is uniform because of high thermal conductivity of copper and silicon; however, the mismatch of CTE between them causes high thermal stress which is alleviated in TSV when it partly filled with copper from analysis by three-dimensional finite element method. Six-axis micro-tester experiment shows the nominal shear strength of the silicone lens formed on a bare silicon with four TSVs improved 10% compared with that without TSVs. Wafer level packaging for LEDs is proposed. LEDs are encapsulated with silicon substrate with four TSVs filled with copper and other four TSVs filled with silicone. The processes of silicon substrate based on MEMS technology are used. TSV is filled with copper partly by two-step electroplating in order to avoid thinning of the substrate for blind vias. The phosphor conformal coating is implemented using capillary micro-channel, which can improve the angular color uniformity and consistency of WLP. The array of silicone lens using the mould method shows high coherence and few defects.
  • Keywords
    Monte Carlo methods; elemental semiconductors; finite element analysis; light emitting diodes; ray tracing; shear strength; silicon; temperature distribution; thermal conductivity; three-dimensional integrated circuits; wafer level packaging; MEMS technology; Monte-Carlo ray-trace method; Si; TSV; angular color uniformity; bare silicon; blind vias; capillary microchannel; hemisphere lens; high-power LED performance; light emitting diodes; light extraction efficiency; mould method; nominal shear strength; phosphor conformal coating; silicon substrate; silicon-based packaging; silicon-based system; silicone lens; six-axis microtester experiment; spherical segment lens; temperature distribution; thermal conductivity; thermal stress; three-dimensional finite element method; two-step electroplating; wafer level packaging; Copper; Lenses; Light emitting diodes; Packaging; Phosphors; Silicon; Through-silicon vias;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4673-1966-9
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2012.6248998
  • Filename
    6248998