Title :
Multichannel fusion models for the parametric classification of multicategory differential brain activity
Author :
Gupta, Lalit ; Chung, Beomsu ; Molfese, Dennis L.
Author_Institution :
Dept. of Electr. & Comput. Eng., Southern Illinois Univ., Carbondale, IL, USA
Abstract :
This work introduces multichannel classification fusion and multichannel data fusion models to fully exploit the different but complementary brain activity information recorded from multiple channels. The goal is to accurately classify differential brain activity into their respective categories. A parametric weighted classification fusion model and three weighted data fusion models (mixture, sum, and concatenation) are introduced. Parametric classifiers are developed for each fusion strategy and the performances of the different strategies are compared by classifying 14-channel evoked potentials (EPs) collected from subjects involved in making explicit match/mismatch comparisons between sequentially presented stimuli. The best performance is obtained using multichannel EP concatenation and the performance improves by incorporating weights in the fusion rules. The fusion strategies introduced are also applicable to other problems involving the classification of multicategory multivariate signals generated from multiple sources.
Keywords :
bioelectric potentials; brain; medical signal processing; pattern matching; sensor fusion; signal classification; evoked potential; multicategory differential brain activity; multichannel data fusion model; multisensor fusion; parametric classification; signal match; signal mismatch; weighted data fusion model; Brain modeling; Cognition; Collision mitigation; Covariance matrix; Electroencephalography; Fusion power generation; Humans; Medical conditions; Psychology; Signal generators; Classification fusion; data fusion; evoked potentials; multi-sensor fusion; parametric classification;
Conference_Titel :
Engineering in Medicine and Biology Society, 2004. IEMBS '04. 26th Annual International Conference of the IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-8439-3
DOI :
10.1109/IEMBS.2004.1403315