• DocumentCode
    2724248
  • Title

    The capability of capability indices with an application to guardbanding in a test environment

  • Author

    Mullenix, Paul

  • Author_Institution
    Harris Semicond., Melbourne, FL, USA
  • fYear
    1990
  • fDate
    10-14 Sep 1990
  • Firstpage
    907
  • Lastpage
    915
  • Abstract
    The author addresses 13 cautions associated with capability indices, covering the areas of computations, assumptions, applications. and interpretations. Some recommended uses are also provided. A naive guardbanding scheme using capability indices is presented and contrasted with a more traditional approach involving a bivariate normal model. A slight modification of the traditional approach, which views consumer loss from the consumer´s point of view, is proposed. Both the capability and modified traditional approaches are applied and contrasted in a semiconductor testing example. The capability approach is shown to be more conservative than the modified traditional approach
  • Keywords
    electronic equipment manufacture; electronic equipment testing; production testing; quality control; semiconductor device testing; QC; bivariate normal model; capability indices; computations; consumer loss; guardbanding; production testing; semiconductor testing; Acceleration; Computer applications; Current measurement; Manufacturing; Production; Sampling methods; Semiconductor device manufacture; Semiconductor device testing; Temperature distribution; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1990. Proceedings., International
  • Conference_Location
    Washington, DC
  • Print_ISBN
    0-8186-9064-X
  • Type

    conf

  • DOI
    10.1109/TEST.1990.114111
  • Filename
    114111