DocumentCode
2724248
Title
The capability of capability indices with an application to guardbanding in a test environment
Author
Mullenix, Paul
Author_Institution
Harris Semicond., Melbourne, FL, USA
fYear
1990
fDate
10-14 Sep 1990
Firstpage
907
Lastpage
915
Abstract
The author addresses 13 cautions associated with capability indices, covering the areas of computations, assumptions, applications. and interpretations. Some recommended uses are also provided. A naive guardbanding scheme using capability indices is presented and contrasted with a more traditional approach involving a bivariate normal model. A slight modification of the traditional approach, which views consumer loss from the consumer´s point of view, is proposed. Both the capability and modified traditional approaches are applied and contrasted in a semiconductor testing example. The capability approach is shown to be more conservative than the modified traditional approach
Keywords
electronic equipment manufacture; electronic equipment testing; production testing; quality control; semiconductor device testing; QC; bivariate normal model; capability indices; computations; consumer loss; guardbanding; production testing; semiconductor testing; Acceleration; Computer applications; Current measurement; Manufacturing; Production; Sampling methods; Semiconductor device manufacture; Semiconductor device testing; Temperature distribution; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1990. Proceedings., International
Conference_Location
Washington, DC
Print_ISBN
0-8186-9064-X
Type
conf
DOI
10.1109/TEST.1990.114111
Filename
114111
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