• DocumentCode
    2724251
  • Title

    A CMOS 6-mW 10-bit 100-MS/s two-step ADC

  • Author

    Chung, Yung-Hui ; Wu, Jieh-Tsorng

  • Author_Institution
    Nat. Chiao-Tung Univ., Hsinchu, Taiwan
  • fYear
    2009
  • fDate
    16-18 Nov. 2009
  • Firstpage
    137
  • Lastpage
    140
  • Abstract
    A 10-bit 100-MS/s two-step ADC was fabricated using a 90 nm CMOS technology. To reduce power dissipation, the ADC uses latch-type comparators for signal digitalization and an open-loop amplifier for residue amplification. The linearity of the residue amplifier is enhanced by digital background calibration. The resolution of the comparators is improved by analog offset calibration. The ADC consumes 6mW from a 1V supply. Measured SNR and SFDR are 58.2 dB and 75 dB respectively. Measured ENOB is 9.34b. The FOM is 100 fJ per conversion-step.
  • Keywords
    CMOS digital integrated circuits; amplifiers; analogue-digital conversion; calibration; comparators (circuits); CMOS technology; SFDR; SNR; analog offset calibration; digital background; latch-type comparators; open-loop amplifier; power 6 mW; residue amplification; signal digitalization; size 90 nm; two-step ADC; word length 10 bit; CMOS technology; Calibration; Capacitors; Energy consumption; Error correction; Latches; Power amplifiers; Preamplifiers; Switches; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 2009. A-SSCC 2009. IEEE Asian
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-4433-5
  • Electronic_ISBN
    978-1-4244-4434-2
  • Type

    conf

  • DOI
    10.1109/ASSCC.2009.5357197
  • Filename
    5357197