DocumentCode :
2724306
Title :
3D-interconnect approach for high end electronics
Author :
Das, Rabindra N. ; Egitto, Frank D. ; Lauffer, John ; Bonitz, Barry ; Wilson, Bill ; Marconi, Francesco ; Poliks, Mark D. ; Markovich, Voya R.
Author_Institution :
Endicott Interconnect Technol., Inc., Endicott, NY, USA
fYear :
2012
fDate :
May 29 2012-June 1 2012
Firstpage :
1333
Lastpage :
1339
Abstract :
This paper presents 3D-interconnect technology to produce a variety of structures and packages suitable for high end electronics. 3D-interconnect can join different size multiple rigid structures for rigid-rigid constructions. For example, a high density circuit card and a low end printed wiring board were attached using 3D-interconnect to achieve functionality similar to a complex board. Various sub-composites, signal-power cores, were laminated with paste filed joining cores (0S/1P) or joining layers (0S/0P) to improve wiring density of a package. A 3D “Package-Interposer-Package” (PIP) integration method was used to attach multiple assembled substrates. An example of a structure consisting of seven stacked substrates attached using PIP approach is given. The PIP approach can provide for replacement, repair, or upgrade of individual substrates in the stack, beneficial for processing of complex, expensive product. In addition 3D-micro bump technology was developed as am alternative to solder based, pasteless 3D interconnects. A variety of materials and processes, including paste, Cu micro pillars, and solder-based micro-bumps were developed for 3D-interconnects. Overall, the present work describes an integrated approach to develop 3D interconnect constructions on various complex package, stacked package, or stacked die packaged configurations.
Keywords :
semiconductor device metallisation; semiconductor device packaging; 0S-0P; 0S-1P; 3D package-interposer-package integration method; 3D-interconnect approach; Cu micro pillars; PIP integration method; complex processing; expensive product; high density circuit card; high end electronics; low end printed wiring board; paste filed joining cores; rigid-rigid constructions; signal-power cores; size multiple rigid structures; solder-based 3D micro-bump technology; Complexity theory; Dielectrics; Integrated circuit interconnections; Joining processes; Silicon; Substrates; Wiring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd
Conference_Location :
San Diego, CA
ISSN :
0569-5503
Print_ISBN :
978-1-4673-1966-9
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2012.6249007
Filename :
6249007
Link To Document :
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