• DocumentCode
    2724315
  • Title

    TSV-based decoupling capacitor schemes in 3D-IC

  • Author

    Song, Eunseok ; Pak, Jun So ; Kim, Joungho

  • Author_Institution
    Dept. of Electr. Eng., KAIST, Daejeon, South Korea
  • fYear
    2012
  • fDate
    May 29 2012-June 1 2012
  • Firstpage
    1340
  • Lastpage
    1344
  • Abstract
    In this study, the scheme of a TSV-based decoupling capacitor stacked chip (DCSC) is proposed as a decoupling capacitor scheme to be possibly implemented in 3D-IC. The conventional decoupling capacitor schemes to be applied in a 3D-IC system include on-chip NMOS capacitors and package-level decoupling capacitor solutions. The proposed TSV-based DCSC scheme that can improve a disadvantage (i.e., relatively small capacitances) in the conventional on-chip NMOS capacitors and a limitation in package-level decoupling capacitor solutions represents excellent 3D-PDN (power delivery network) performance. In the comparison of the proposed TSV-based DCSC scheme with the conventional decoupling capacitor schemes, the propose scheme shows a similar level to the chip PDN that implements on-chip NMOS capacitors more than 10 nF and an SSN suppression effect of 93% compared to that of on-package decoupling capacitors. However, in the case of the on-chip NMOS capacitors, as an additional chip area, few mm × few mm, is required to ensure a capacitance of 10 nF, it is a scheme that has a limitation in increasing chip sizes. In conclusion, the proposed TSV-based DCSC is a decoupling capacitor solution that represents the most appropriate and excellent PDN performance in a 3D-IC system.
  • Keywords
    MOS capacitors; integrated circuit noise; integrated circuit packaging; three-dimensional integrated circuits; 3D integrated circuit; TSV; capacitance 10 nF; on-chip NMOS capacitor; package level decoupling capacitor; power delivery network; simultaneous switching noise suppression; stacked chip; Capacitance; Capacitors; Impedance; Inductance; MOS devices; System-on-a-chip; Through-silicon vias;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4673-1966-9
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2012.6249008
  • Filename
    6249008