DocumentCode
2724315
Title
TSV-based decoupling capacitor schemes in 3D-IC
Author
Song, Eunseok ; Pak, Jun So ; Kim, Joungho
Author_Institution
Dept. of Electr. Eng., KAIST, Daejeon, South Korea
fYear
2012
fDate
May 29 2012-June 1 2012
Firstpage
1340
Lastpage
1344
Abstract
In this study, the scheme of a TSV-based decoupling capacitor stacked chip (DCSC) is proposed as a decoupling capacitor scheme to be possibly implemented in 3D-IC. The conventional decoupling capacitor schemes to be applied in a 3D-IC system include on-chip NMOS capacitors and package-level decoupling capacitor solutions. The proposed TSV-based DCSC scheme that can improve a disadvantage (i.e., relatively small capacitances) in the conventional on-chip NMOS capacitors and a limitation in package-level decoupling capacitor solutions represents excellent 3D-PDN (power delivery network) performance. In the comparison of the proposed TSV-based DCSC scheme with the conventional decoupling capacitor schemes, the propose scheme shows a similar level to the chip PDN that implements on-chip NMOS capacitors more than 10 nF and an SSN suppression effect of 93% compared to that of on-package decoupling capacitors. However, in the case of the on-chip NMOS capacitors, as an additional chip area, few mm × few mm, is required to ensure a capacitance of 10 nF, it is a scheme that has a limitation in increasing chip sizes. In conclusion, the proposed TSV-based DCSC is a decoupling capacitor solution that represents the most appropriate and excellent PDN performance in a 3D-IC system.
Keywords
MOS capacitors; integrated circuit noise; integrated circuit packaging; three-dimensional integrated circuits; 3D integrated circuit; TSV; capacitance 10 nF; on-chip NMOS capacitor; package level decoupling capacitor; power delivery network; simultaneous switching noise suppression; stacked chip; Capacitance; Capacitors; Impedance; Inductance; MOS devices; System-on-a-chip; Through-silicon vias;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd
Conference_Location
San Diego, CA
ISSN
0569-5503
Print_ISBN
978-1-4673-1966-9
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2012.6249008
Filename
6249008
Link To Document