DocumentCode :
2724404
Title :
Application of coreless substrate to package on package architectures
Author :
Nickerson, Robert ; Olmedo, Reynaldo ; Mortensen, Russell ; Chee, Choong Kooi ; Goyal, Sanjay ; Low, Ai Ling ; Gealer, Charles
Author_Institution :
Intel Corp., Chandler, AZ, USA
fYear :
2012
fDate :
May 29 2012-June 1 2012
Firstpage :
1368
Lastpage :
1371
Abstract :
The high performance application processors found in today´s hand held wireless and mobile computing products, such as smart phones and tablet computers, require packages that can support demanding device performance and dense form factor requirements. The package architecture must enable the required signal routing, signal integrity, power delivery, physical form factor, manufacturability and cost. This paper reviews the approach taken to design and implement a package on package (PoP) that enables the integration of a 32nm silicon node processor with dual channel LPDDR memory in a compact 12×12 mm, 0.4 mm BGA pitch solution. The coreless substrate package technology used in this design allows the routing of signals from a 150 um silicon bump pitch array, while achieving a 0.7 mm bottom package z-height. Selection of the PoP interconnect scheme, signal routing approach, surface mount and reliability performance are addressed.
Keywords :
DRAM chips; ball grid arrays; elemental semiconductors; integrated circuit design; integrated circuit interconnections; integrated circuit packaging; integrated circuit reliability; silicon; surface mount technology; BGA pitch solution; PoP architectures; PoP interconnect scheme; Si; coreless substrate package technology; dual channel LPDDR memory; handheld wireless products; high performance application processors; mobile computing products; package on package architectures; physical form factor; power delivery; reliability performance; signal integrity; signal routing approach; silicon bump pitch array; silicon node processor; size 32 nm; smart phones; surface mount technology; tablet computers; Performance evaluation; Program processors; Reliability; Shape; Silicon; Substrates; Surface treatment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd
Conference_Location :
San Diego, CA
ISSN :
0569-5503
Print_ISBN :
978-1-4673-1966-9
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2012.6249013
Filename :
6249013
Link To Document :
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