Title :
Development of a new standard for test
Author :
Sebesta, William W. ; Verhelst, Bas ; Wahl, Michael G.
Author_Institution :
IBM Corp., Endicott, NY, USA
Abstract :
The authors present a general view of the development of a new standard for test data, the EDIF (Electronic Design Interchange Format) Test Extension. Owing to the large amount of data that have to be described, the focus is on the methodology which is used in the development process to show the efficiency and power of the new standard. A conceptual model describing the basic aspects of testing is shown, and the methods used to build up the information model are presented and examples given. The approach used leads to a standard which is well structured and easy to understand. In addition, the information model can be used for the evaluation of other standards and is essential for the integration of standards in the future
Keywords :
automatic test equipment; automatic testing; electronic engineering computing; electronic equipment testing; production testing; standards; CAD; EDIF; Electronic Design Interchange Format; automatic testing; conceptual model; efficiency; electronic equipment testing; information model; production testing; standard; Automatic testing; Circuit testing; Laboratories; Logic testing; Power system modeling; Signal design; Software testing; Standards development; Test equipment; Timing;
Conference_Titel :
Test Conference, 1990. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-9064-X
DOI :
10.1109/TEST.1990.114120
