Wave+: An easy-to-use vector generation language for compilers

Author

Handa, Masahiro ; Steinweg, Russell L.

Author_Institution

VLSI Technol. Inc., San Jose, CA, USA

fYear

1990

fDate

10-14 Sep 1990

Firstpage

994

Lastpage

999

Abstract

The authors describe a high-level test vector description language, Wave+, that is specially tailored to the development of vector generators for ASIC (application-specific integrated-circuit) cell compilers. The motivation for such a language is described, along with special problems inherent in compiled cells, which may have variable function and port configuration. Various features of the language, including its abstract transition-oriented and block-oriented vector model and its control structures, are described. The advantages of the language including its simplicity and intuitiveness, which make it easy to use, for compiler design engineers with little software expertise are summarized

Keywords

application specific integrated circuits; automatic testing; circuit layout CAD; integrated circuit testing; logic testing; specification languages; ASIC; RAM; ROM; Wave+; abstract transition oriented model; application-specific integrated-circuit; block-oriented vector model; compilers; high-level test vector; mode assignment; mode declaration; vector generation language; vector generators; Application specific integrated circuits; Automatic control; Automatic testing; Circuit faults; Circuit testing; Connectors; Design engineering; Logic testing; Read only memory; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1990. Proceedings., International

Conference_Location

Washington, DC

Print_ISBN

0-8186-9064-X

Type

conf

DOI

10.1109/TEST.1990.114121

Filename

114121