Title :
Weighted random test program generation for a per-pin tester
Author :
Gartner, J. ; Driscoll, B. ; Forlenza, D. ; Forlenza, O. ; Koprowski, T. ; Lizambri, T. ; Olsen, R. ; Robertson, S. ; Ryan, P. ; Walter, A.
Author_Institution :
IBM East Fishkill, Hopewell Junction, NY, USA
Abstract :
The authors present an overview of a comprehensive software system that serves as an automatic bridge between computer-aided-design- (CAD-) generated weighted random patterns (WRPs-) and a per-pin tester that incorporates dedicated hardware to support WRP testing. A test program generation system that integrates a level-sensitive-scan-design (LSSD-) based design system with a per-pin tester containing WRP hardware has been architected. This system generates complete test programs and permits the direct release of hundreds of ASIC (application-specific integrated circuit) devices into manufacturing. The benefits of low test data volume, improved test coverage, and finer diagnostic resolution provided by the WRP methodology are realized. The capture of delay defects is aided by the availability of several timing edges on a per-pin basis
Keywords :
VLSI; application specific integrated circuits; automatic programming; automatic testing; bridge instruments; circuit CAD; logic CAD; logic testing; random processes; ASIC; application-specific integrated circuit; automatic bridge; delay defects; diagnostic resolution; level-sensitive-scan-design; per-pin tester; test coverage; test program generation; timing edges; weighted random patterns; Application specific integrated circuits; Automatic test pattern generation; Automatic testing; Bridge circuits; Circuit testing; Hardware; Software systems; Software testing; System testing; Test pattern generators;
Conference_Titel :
Test Conference, 1990. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-9064-X
DOI :
10.1109/TEST.1990.114122
