• DocumentCode
    2724460
  • Title

    Serial nonrigid vascular registration using weighted normalized mutual information

  • Author

    Suh, J.W. ; Scheinost, D. ; Qian, X. ; Sinusas, A.J. ; Breuer, C.K. ; Papademetris, X.

  • Author_Institution
    Diagnostic Radiol., Yale Univ., New Haven, CT, USA
  • fYear
    2010
  • fDate
    14-17 April 2010
  • Firstpage
    25
  • Lastpage
    28
  • Abstract
    Vascular registration is a challenging problem with many potential applications. However, registering vessels accurately is difficult as they often occupy a small portion of the image and their relative motion/deformation is swamped by the displacements seen in large organs such as the heart and the liver. Our registration method uses a vessel detection algorithm to generate a vesselness image (probability of having a vessel at any given voxel) which is used to construct a weighting factor that is used to modify the intensity metric to give preference to vascular structures while maintaining the larger context. Therefore, our proposing method uses fully data-driven calculated weights and needs no prior knowledge for the weight calculation. We applied our method to the registration of serial MRI lamb images obtained from studies on tissue engineered vascular grafts and demonstrate encouraging performance as compared to non-weighted registration methods.
  • Keywords
    biomechanics; biomedical MRI; blood vessels; image registration; medical image processing; tissue engineering; deformation; heart; liver; serial MRI lamb images; serial nonrigid vascular registration; tissue engineered vascular grafts; vessel detection algorithm; vesselness image; weighted normalized mutual information; weighting factor; Animals; Arteries; Biomedical engineering; Biomedical imaging; Cardiac disease; Entropy; Heart; Histograms; Liver; Mutual information; vascular registration; weighted mutual information;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Imaging: From Nano to Macro, 2010 IEEE International Symposium on
  • Conference_Location
    Rotterdam
  • ISSN
    1945-7928
  • Print_ISBN
    978-1-4244-4125-9
  • Electronic_ISBN
    1945-7928
  • Type

    conf

  • DOI
    10.1109/ISBI.2010.5490422
  • Filename
    5490422