An empirical relationship between test transparency and fault coverage

Author

Elo, Robert B.

Author_Institution

Intel Corp., Santa Clara, CA, USA

fYear

1990

fDate

10-14 Sep 1990

Firstpage

1006

Lastpage

1011

Abstract

The concept of test transparency was used to analyze the reject data from different fault coverage soft bins. The device used in the study was a gate array with 12.5 K equivalent logic gates. As additional vectors were generated they were isolated into separate modules within the sort program. The sort program shell was altered to provide a soft bin count of the number of failures incurred within each module. This information was then uploaded automatically into the manufacturing database. The results presented are based on functional test results from over 350000 dice. It is shown that Boolean testing can be represented as a linear relationship between test transparency and fault coverage. The linear coefficients are sensitive to the defect type for the stuck-at model fault coverage. The linear coefficients are also sensitive to the fault vector generation methodology

Keywords

Boolean algebra; automatic testing; electronic engineering computing; failure analysis; fault location; logic arrays; logic testing; manufacturing data processing; modules; production testing; Boolean testing; automatic testing; fault coverage; fault vector generation; functional test; gate array; linear coefficients; logic gates; manufacturing database; modules; soft bin count; sort program shell; stuck-at model; test transparency; Benchmark testing; Circuit faults; Circuit testing; Displays; Engines; Fault detection; Logic devices; Logic testing; Semiconductor device modeling; Vectors;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1990. Proceedings., International

Conference_Location

Washington, DC

Print_ISBN

0-8186-9064-X

Type

conf

DOI

10.1109/TEST.1990.114123

Filename

114123