Title :
A picosecond external electro-optic prober using laser diodes
Author :
Shinagawa, Mitsuru ; Nagatsuma, Tado
Author_Institution :
NTT LSI Lab., Kanagawa, Japan
Abstract :
A compact and easy-to-handle optical prober developed for testing integrated circuits fabricated on any substrate is introduced. This prober is based on external electro-optic (EO) sampling using a semiconductor laser diode as an optical probing pulse source. The minimum detectable voltage is as small as 11 mV/√Hz, which is close to the shot noise limited value. Temporal resolution is 24 ps, which is limited by the optical probing pulsewidth. Comparison of the measured waveform of the EO sampling with that of a conventional electrical sampling oscilloscope shows excellent agreement between the two. The prober is successfully applied to waveform diagnosis at internal nodes in gigahertz-band analog integrated circuits
Keywords :
electro-optical devices; integrated circuit testing; linear integrated circuits; measurement by laser beam; semiconductor junction lasers; waveform analysis; 24 ps; GHz band; analog integrated circuits; integrated circuits; internal nodes; laser diodes; measured waveform; optical probing pulse source; picosecond external electro-optic prober; pulsewidth; sampling; waveform diagnosis; Circuit testing; Diode lasers; Gunshot detection systems; Integrated circuit testing; Integrated optics; Optical noise; Optical pulses; Photonic integrated circuits; Sampling methods; Substrates;
Conference_Titel :
Test Conference, 1990. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-9064-X
DOI :
10.1109/TEST.1990.114127
