Title :
New approach to integrate LSI design databases with e-beam tester
Author :
Hu, Arthur ; Niijima, Hironobu
Author_Institution :
Advantest America Inc., Santa Clara, CA, USA
Abstract :
An integrated electron-beam tester is described. A set of novel computer-aided-verification tools based on a new software architecture has been implemented. It is closely coupled with industry-proven, high-performance e-beam hardware and CAD (computer-aided-design) databases. This results in a high throughput environment, allowing VLSI designers to debug their chips much more efficiently than with conventional approaches. These tools have a lower data preprocessing time, which is achieved by direct conversion of user databases, a higher run-time performance due to the application of the new architecture, and a lower disk storage usage
Keywords :
VLSI; automatic testing; circuit CAD; electron beam applications; integrated circuit manufacture; integrated circuit testing; CAD; IC testing; LSI design databases; VLSI; automatic testing; computer-aided-verification tools; data preprocessing time; disk storage usage; e-beam tester; integrated electron-beam tester; run-time performance; software architecture; Computer industry; Data preprocessing; Databases; Design automation; Hardware; Large scale integration; Software architecture; Testing; Throughput; Very large scale integration;
Conference_Titel :
Test Conference, 1990. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-9064-X
DOI :
10.1109/TEST.1990.114128
