New approach to integrate LSI design databases with e-beam tester

Author

Hu, Arthur ; Niijima, Hironobu

Author_Institution

Advantest America Inc., Santa Clara, CA, USA

fYear

1990

fDate

10-14 Sep 1990

Firstpage

1040

Lastpage

1048

Abstract

An integrated electron-beam tester is described. A set of novel computer-aided-verification tools based on a new software architecture has been implemented. It is closely coupled with industry-proven, high-performance e-beam hardware and CAD (computer-aided-design) databases. This results in a high throughput environment, allowing VLSI designers to debug their chips much more efficiently than with conventional approaches. These tools have a lower data preprocessing time, which is achieved by direct conversion of user databases, a higher run-time performance due to the application of the new architecture, and a lower disk storage usage

Keywords

VLSI; automatic testing; circuit CAD; electron beam applications; integrated circuit manufacture; integrated circuit testing; CAD; IC testing; LSI design databases; VLSI; automatic testing; computer-aided-verification tools; data preprocessing time; disk storage usage; e-beam tester; integrated electron-beam tester; run-time performance; software architecture; Computer industry; Data preprocessing; Databases; Design automation; Hardware; Large scale integration; Software architecture; Testing; Throughput; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1990. Proceedings., International

Conference_Location

Washington, DC

Print_ISBN

0-8186-9064-X

Type

conf

DOI

10.1109/TEST.1990.114128

Filename

114128