DocumentCode :
2724555
Title :
TDRC-a symbolic simulation based design for testability rules checker
Author :
Varma, Prab
Author_Institution :
Teradyne, Santa Clara, CA, USA
fYear :
1990
fDate :
10-14 Sep 1990
Firstpage :
1055
Lastpage :
1064
Abstract :
A symbolic simulation methodology that can be used to verify a set of standard scan-path-based, ad hoc, and boundary-scan design-for-testability (DFT) rules is proposed, and a DFT rule checker, TDRC (testability design rule checker), that uses this methodology is described. In this methodology, symbolic tokens are used to represent the types of signals applied to the primary inputs of the circuit, and, in a process analogous to simulation, these tokens are propagated through the circuit using a set of simulation rules. A check is then made to verify that the required tokens have been propagated to each scan element and that only allowed tokens have reached particular element and circuit ports. The proposed simulation methodology differs from previous path-tracing approaches in that symbolic tokens are propagated to the output of an object, possibly in modified form, depending on the other tokens reaching both the inputs and the logical function of the object. TDRC has been successfully used to identify real problems in real ASIC (application-specific integrated-circuit designs)
Keywords :
application specific integrated circuits; automatic testing; digital simulation; integrated circuit testing; logic testing; ASIC; ad hoc rules; application-specific integrated-circuit designs; boundary-scan design-for-testability; clock token propagation; data token propagation; digital simulation; hierarchical rule checking; logical function; path-tracing; prohibition rules; scan token propagation; symbolic simulation; symbolic tokens; testability design rule checker; testability rules checker; Automatic test pattern generation; Automatic testing; Circuit simulation; Circuit testing; Design for testability; Electronic design automation and methodology; Read only memory; Sequential analysis; Sequential circuits; Test pattern generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1990. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-9064-X
Type :
conf
DOI :
10.1109/TEST.1990.114130
Filename :
114130
Link To Document :
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