DocumentCode :
2724614
Title :
Single/few-layer boron nitride-based nanocomposites for high thermal conductivity underfills
Author :
Lin, Ziyin ; Yao, Yagang ; McNamara, Andrew ; Moon, Kyoung-sik ; Wong, C.P.
Author_Institution :
Sch. of Mater. Sci. & Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
2012
fDate :
May 29 2012-June 1 2012
Firstpage :
1437
Lastpage :
1441
Abstract :
Thermal management in 3D packaging plays an important role in the device performance and reliability. The development of thermally conductive underfills is highly crucial, but still challenging. In this work, single/few-layer boron nitride (BN) was exfoliated from bulk h-BN flakes and was incorporated into epoxy resin via a solvent transfer method. [1] The structure of exfoliated BN was characterized by varieties of techniques, including scanning electron microscopy, transmission electron microscopy, electron diffraction, Raman microscopy, and UV-vis microscopy. The single/few layer boron nitride/epoxy composite was characterized by thermomechanical analysis and thermogravimetric analysis. The thermal conductivity of exfoliated BN was measured by an infrared thermal imaging method. A significant enhancement of thermal conductivity (220%) is observed at a low filler loading of 5 wt%, indicating that the single/few-layer BN is a promising filler for the development of novel underfill for 3D packaging.
Keywords :
boron compounds; infrared imaging; integrated circuit packaging; integrated circuit reliability; nanocomposites; resins; thermal analysis; thermal conductivity; thermal management (packaging); thermomechanical treatment; 3D packaging; BN; Raman microscopy; UV-vis microscopy; bulk h-BN flake; electron diffraction; epoxy composite; epoxy resin; exfoliation; high thermal conductivity underfill development; infrared thermal imaging method; low filler loading; nanocomposite; reliability; scanning electron microscopy; single-few-layer BN; single-few-layer boron nitride; solvent transfer method; thermal management; thermogravimetric analysis; thermomechanical analysis; transmission electron microscopy; Conductivity; Electronic packaging thermal management; Heating; Loading; Materials; Thermal conductivity; Thermal loading;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd
Conference_Location :
San Diego, CA
ISSN :
0569-5503
Print_ISBN :
978-1-4673-1966-9
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2012.6249025
Filename :
6249025
Link To Document :
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