• DocumentCode
    2724630
  • Title

    Nano-micro particle filled thermal interface materials: Towards materials development, characterization, assembly, and performance evaluation

  • Author

    Das, Rabindra N. ; Chenelly, Evan ; Kopp, Erich ; Alcoe, Dave ; Poliks, Mark D. ; Markovich, Voya R.

  • Author_Institution
    Endicott Interconnect Technol., Inc., Endicott, NY, USA
  • fYear
    2012
  • fDate
    May 29 2012-June 1 2012
  • Firstpage
    1442
  • Lastpage
    1447
  • Abstract
    Thermal interface materials (TIM) used to improve the conductivity between mating components in an electronic assembly are discussed. A variety of materials including adhesives, gels, greases, fluids were used in this study. Both greases and pastes are considered, to improve the contact resistance of stress decoupling and stress coupling interfaces, respectively. Nanoparticles, micro particles, low melting point (LMP) fillers, and mixtures of nano-micro particles were combined to obtain both decreased interparticle thermal resistance and decreased bulk thermal resistance in thermal pastes. An evaluation of thermal grease filler materials was also conducted. A steady-state conductivity test was employed to measure conductivity. Adhesive materials were tested at various fixed bondline thicknesses and had thermal impedances ranging from 170 to 53 mm2 K/W. The performance of greases varied from 70 to 11 mm2 K/W at low bondline with a varied load. For thermal pastes, cross section measurements were used to measure particle dispersion throughout the interface. The paper also presents a nanoparticle dispersion approach to prepare temperature and time stable nanogels. Several nanogels were evaluated after three years post-preparation, using transmission electron microscopy (TEM), to check particle distribution in the nanogel.
  • Keywords
    adhesive bonding; contact resistance; gels; melting point; nanoparticles; self-assembly; thermal resistance; transmission electron microscopy; adhesive materials; bulk thermal resistance; contact resistance; cross section measurements; electronic assembly; fixed bondline thicknesses; low melting point fillers; materials development; mating components; microparticle filled materials; nanoparticle dispersion; nanoparticle filled materials; performance evaluation; steady-state conductivity test; stress coupling interfaces; stress decoupling; thermal grease filler materials; thermal impedances; thermal interface materials; thermal pastes; time stable nanogels; transmission electron microscopy; Conductivity; Impedance; Materials; Nanoparticles; Silver; Surface impedance; Thermal conductivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4673-1966-9
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2012.6249026
  • Filename
    6249026