DocumentCode :
2724630
Title :
Nano-micro particle filled thermal interface materials: Towards materials development, characterization, assembly, and performance evaluation
Author :
Das, Rabindra N. ; Chenelly, Evan ; Kopp, Erich ; Alcoe, Dave ; Poliks, Mark D. ; Markovich, Voya R.
Author_Institution :
Endicott Interconnect Technol., Inc., Endicott, NY, USA
fYear :
2012
fDate :
May 29 2012-June 1 2012
Firstpage :
1442
Lastpage :
1447
Abstract :
Thermal interface materials (TIM) used to improve the conductivity between mating components in an electronic assembly are discussed. A variety of materials including adhesives, gels, greases, fluids were used in this study. Both greases and pastes are considered, to improve the contact resistance of stress decoupling and stress coupling interfaces, respectively. Nanoparticles, micro particles, low melting point (LMP) fillers, and mixtures of nano-micro particles were combined to obtain both decreased interparticle thermal resistance and decreased bulk thermal resistance in thermal pastes. An evaluation of thermal grease filler materials was also conducted. A steady-state conductivity test was employed to measure conductivity. Adhesive materials were tested at various fixed bondline thicknesses and had thermal impedances ranging from 170 to 53 mm2 K/W. The performance of greases varied from 70 to 11 mm2 K/W at low bondline with a varied load. For thermal pastes, cross section measurements were used to measure particle dispersion throughout the interface. The paper also presents a nanoparticle dispersion approach to prepare temperature and time stable nanogels. Several nanogels were evaluated after three years post-preparation, using transmission electron microscopy (TEM), to check particle distribution in the nanogel.
Keywords :
adhesive bonding; contact resistance; gels; melting point; nanoparticles; self-assembly; thermal resistance; transmission electron microscopy; adhesive materials; bulk thermal resistance; contact resistance; cross section measurements; electronic assembly; fixed bondline thicknesses; low melting point fillers; materials development; mating components; microparticle filled materials; nanoparticle dispersion; nanoparticle filled materials; performance evaluation; steady-state conductivity test; stress coupling interfaces; stress decoupling; thermal grease filler materials; thermal impedances; thermal interface materials; thermal pastes; time stable nanogels; transmission electron microscopy; Conductivity; Impedance; Materials; Nanoparticles; Silver; Surface impedance; Thermal conductivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd
Conference_Location :
San Diego, CA
ISSN :
0569-5503
Print_ISBN :
978-1-4673-1966-9
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2012.6249026
Filename :
6249026
Link To Document :
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