• DocumentCode
    2724760
  • Title

    Gold nanowires: Deposition, characterization and application to the Mass Spectrometry detection of low-molecular weight analytes

  • Author

    Colaianni, L. ; Kung, S.C. ; Taggart, D. ; De Giorgio, V. ; Greaves, J. ; Cioffi, Noreen ; Penner, R.M.

  • Author_Institution
    Dipt. di Chimica, Univ. degli Studi di Bari, Bari, Italy
  • fYear
    2009
  • fDate
    25-26 June 2009
  • Firstpage
    20
  • Lastpage
    24
  • Abstract
    Nanowire fabrication methods are usually classified either as dasiatop downpsila, including for example photo- or electron beam-lithography, or dasiabottom uppsila, involving the synthesis of nanowires from smaller precursors. Lithographically patterned nanowire electrodeposition (LPNE) combines the attributes of the photolithography approach with the versatility of bottom-up electrodeposition methods. In the present study, gold nanowires (Au-NWs) have been electrodeposited using LPNE. The nanomaterials have been then subjected to a spectroscopic and morphological characterization by means of X-Ray Photoelectron Spectroscopy (XPS), Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), X-Ray Diffraction (XRD) and Atomic Force Microscopy (AFM). Finally, Au-NWs have been successfully used as desorption/ionization promoters for the Laser-Induced Desorption-Ionization Mass Spectrometry (LDI-MS) detection of low-molecular weight analytes, such as amino acids and peptides.
  • Keywords
    X-ray diffraction; X-ray photoelectron spectra; atomic force microscopy; electrodeposition; electron beam lithography; gold; mass spectra; nanolithography; nanopatterning; nanowires; organic compounds; photolithography; scanning electron microscopy; transmission electron microscopy; Au; X-ray diffraction; X-ray photoelectron spectroscopy; atomic force microscopy; electron beam lithography; laser induced desorption ionization mass spectrometry; lithographically patterned nanowire electrodeposition; molecular weight; photolithography; scanning electron microscopy; transmission electron microscopy; Atomic force microscopy; Electron beams; Fabrication; Gold; Lithography; Mass spectroscopy; Nanowires; Photoelectron microscopy; Scanning electron microscopy; Transmission electron microscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advances in sensors and Interfaces, 2009. IWASI 2009. 3rd International Workshop on
  • Conference_Location
    Trani
  • Print_ISBN
    978-1-4244-4708-4
  • Electronic_ISBN
    978-1-4244-4709-1
  • Type

    conf

  • DOI
    10.1109/IWASI.2009.5184761
  • Filename
    5184761