DocumentCode :
2724896
Title :
Neutron detection through an SRAM-based test bench
Author :
Dilillo, Luigi ; Wrobel, Frédéric ; Galliere, Jean-Marc ; Saigné, Frédéric
Author_Institution :
Lab. d´´Inf., de Robot. et de Microelectron. de Montpellier - LIRMM, Univ. de Montpellier III, Montpellier, France
fYear :
2009
fDate :
25-26 June 2009
Firstpage :
64
Lastpage :
69
Abstract :
In this paper, we propose a technique for the detection of neutrons that relies on the sensitivity of SRAM cells to particle radiation. In particular, we introduce a system based on a memory test bench that records the neutron reactions in the memory array. This system allows a good flexibility from different points of view. It is conceived to be modular, programmable, low power consuming and portable. Consequently, it can operate in various experimental conditions such as under artificial sources of particles as well as in natural ambience, from the Earth surface to spatial environment. The system is also independent of the type of memory, allowing the use and the study of the interaction between particles and electronic devices built with different technologies.
Keywords :
SRAM chips; neutron detection; neutron sources; nuclear electronics; SRAM cells; electronic devices; memory test bench; natural radiative environment; neutron detection; neutron reactions; neutron sources; particle radiation; Built-in self-test; CMOS technology; Circuit testing; Earth; Neutrons; Radiation detectors; Random access memory; Robots; System testing; Uniform resource locators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advances in sensors and Interfaces, 2009. IWASI 2009. 3rd International Workshop on
Conference_Location :
Trani
Print_ISBN :
978-1-4244-4708-4
Electronic_ISBN :
978-1-4244-4709-1
Type :
conf
DOI :
10.1109/IWASI.2009.5184769
Filename :
5184769
Link To Document :
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