DocumentCode
2724896
Title
Neutron detection through an SRAM-based test bench
Author
Dilillo, Luigi ; Wrobel, Frédéric ; Galliere, Jean-Marc ; Saigné, Frédéric
Author_Institution
Lab. d´´Inf., de Robot. et de Microelectron. de Montpellier - LIRMM, Univ. de Montpellier III, Montpellier, France
fYear
2009
fDate
25-26 June 2009
Firstpage
64
Lastpage
69
Abstract
In this paper, we propose a technique for the detection of neutrons that relies on the sensitivity of SRAM cells to particle radiation. In particular, we introduce a system based on a memory test bench that records the neutron reactions in the memory array. This system allows a good flexibility from different points of view. It is conceived to be modular, programmable, low power consuming and portable. Consequently, it can operate in various experimental conditions such as under artificial sources of particles as well as in natural ambience, from the Earth surface to spatial environment. The system is also independent of the type of memory, allowing the use and the study of the interaction between particles and electronic devices built with different technologies.
Keywords
SRAM chips; neutron detection; neutron sources; nuclear electronics; SRAM cells; electronic devices; memory test bench; natural radiative environment; neutron detection; neutron reactions; neutron sources; particle radiation; Built-in self-test; CMOS technology; Circuit testing; Earth; Neutrons; Radiation detectors; Random access memory; Robots; System testing; Uniform resource locators;
fLanguage
English
Publisher
ieee
Conference_Titel
Advances in sensors and Interfaces, 2009. IWASI 2009. 3rd International Workshop on
Conference_Location
Trani
Print_ISBN
978-1-4244-4708-4
Electronic_ISBN
978-1-4244-4709-1
Type
conf
DOI
10.1109/IWASI.2009.5184769
Filename
5184769
Link To Document