Title :
Analysis of snubber-clamped diode-string mixed voltage interface ESD protection network for advanced microprocessors
Author :
Voldman, Steven H. ; Gerosa, G. ; Gross, V.P. ; Dickson, Vaughn P. ; Furkay, Stephen ; Slinkman, James
Author_Institution :
Microelectron. Div., IBM Corp., Essex Junction, VT, USA
Abstract :
A novel snubber-clamped diode-string ESD protection circuit for mixed voltage interface microprocessor applications is described. Analytical models, circuit simulation, electrical characterization, ESD electrothermal simulation, ESD test data, and an ESD analytical failure model are shown for shallow trench isolation (STI) and LOCOS CMOS technologies.
Keywords :
CMOS digital integrated circuits; circuit analysis computing; electrostatic discharge; failure analysis; integrated circuit layout; integrated circuit modelling; isolation technology; microprocessor chips; protection; snubbers; thermal analysis; ESD analytical failure model; ESD electrothermal simulation; ESD protection network; ESD test data; LOCOS CMOS technologies; circuit simulation; diode-string type; electrical characterization; microprocessor applications; mixed voltage interface; shallow trench isolation; snubber-clamped configuration; Analytical models; CMOS technology; Circuit simulation; Circuit testing; Diodes; Electrostatic discharge; Electrothermal effects; Microprocessors; Protection; Voltage;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 1995
Conference_Location :
Phoenix, AZ, USA
Print_ISBN :
1-878303-59-7
DOI :
10.1109/EOSESD.1995.478267
