DocumentCode
2725050
Title
Creating modular test systems
Author
Wilhite, Bruce ; Craig, Donald
Author_Institution
Lockheed Martin
fYear
2010
fDate
13-16 Sept. 2010
Firstpage
1
Lastpage
1
Abstract
Paper not available at time of Publication
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON, 2010 IEEE
Conference_Location
Orlando, FL, USA
ISSN
1088-7725
Print_ISBN
978-1-4244-7960-3
Type
conf
DOI
10.1109/AUTEST.2010.5613559
Filename
5613559
Link To Document