DocumentCode :
2725109
Title :
QuickLearn- A Novel Supervised On-line Learning Algorithm for Pattern Recognition
Author :
Akhbardeh, Alireza ; Värri, Alpo
Author_Institution :
Inst. of Signal Process., Tampere Univ. of Technol.
fYear :
2006
fDate :
24-26 July 2006
Firstpage :
207
Lastpage :
212
Abstract :
This paper introduces a new kind of supervised classifier so-called QuickLearn (QL) which is utilized for training as well as for recall. It has two stages. Hn the first stage, mapping level, input data are represented to the multi input-single output mapping function (MF) with fixed weights during the training phase. So, this kind of map only is a kind of simple shifting and scaling of the input data before representing to the second stage. We can select any kind of mathematical function for this map while its complexity depends on input data complexity. By representing input data to the first stage, MF gives us a scalar value. After shifting and scaling that value to the range [0,T], we can round it to have an integer value (y). The second stage, matching level, only includes an array with T cells called Affine Lootk-up Table (ALT). The training phase for QL includes only one step, no learning cycles. In this single step, the integer value y is used as a reference address to call and upload the label for corresponding input samples in N cells of ALT (copying label from the cell [y-N/2] till the cell [y+ N/2-1]) (data leakages to N-1 neighbor cells). Elapsed time for training a fresh QL classifier is typically only few milliseconds. In the testing phase, we need only to recall and introduce value of the cell with the index y as the final output (final winner class). The QL is evaluated and compared with existing supervised neural networks on a variety of some well known pattern classification problems
Keywords :
computational complexity; learning (artificial intelligence); pattern recognition; QuickLearn; data complexity; learning algorithm; multi input-single output mapping function; pattern recognition; supervised classifier; Classification algorithms; Electronic mail; Neural networks; Paper technology; Pattern classification; Pattern recognition; Signal processing algorithms; Supervised learning; Table lookup; Testing; Affine Look-up Table; Mapping; QuickLearn; Supervised On-line Learning Algorithm; classification; data leakage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Adaptive and Learning Systems, 2006 IEEE Mountain Workshop on
Conference_Location :
Logan, UT
Print_ISBN :
1-4244-0166-6
Type :
conf
DOI :
10.1109/SMCALS.2006.250717
Filename :
4016788
Link To Document :
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