• DocumentCode
    2725119
  • Title

    Polyhedral oligomeric silsesquioxanes (POSS)-filled underfill with excellent high temperature performance

  • Author

    Lin, Ziyin ; Lau, Shunyi ; Moon, Kyoung-sik ; Wong, C.P.

  • Author_Institution
    Sch. of Mater. Sci. & Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2012
  • fDate
    May 29 2012-June 1 2012
  • Firstpage
    1599
  • Lastpage
    1604
  • Abstract
    Advanced underfill material plays an important role in device reliability by distributing the thermal stress and providing environmental protection. Recently there is an increasing demand for low stress underfill which requires low coefficient of thermal expansion (CTE), low modulus and good flowablity. In this report, polyhedral oligomeric silsesquioxanes (POSS) functionalized with epoxy groups are used as potential CTE reducing fillers due to their ability to participant in the polymerization reaction. It was found that the POSS/epoxy composite shows excellent high temperature performance, including the increased Tg, lowered CTE and high storage modulus above Tg, and good thermal stability. Moreover, the effects of the length of organic moieties on the chemical and thermomechanical properties of POSS/epoxy composite were systematically investigated.
  • Keywords
    integrated circuit reliability; polymerisation; thermal expansion; thermal stability; thermal stresses; POSS-epoxy composite; environmental protection; epoxy groups; excellent high temperature performance; flowablity; low stress underfill; polyhedral oligomeric silsesquioxanes; reliability; thermal expansion; thermal stability; thermomechanical properties; Curing; Epoxy resins; Heating; Loading; Silicon compounds; Thermal stability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4673-1966-9
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2012.6249050
  • Filename
    6249050