Title :
Characterisation of thermally poled multilayered silicate thin films
Author :
An, H. ; Fleming, S.
Author_Institution :
Opt. Fibre Technol. Centre, Univ. of Sydney, Sydney, NSW
Abstract :
We report measurements of the spatial profile of the second-order optical nonlinearity induced in thermally poled silicate thin films. Contrary to the case of bulk silica, the nonlinearity was mainly located at surfaces and interfaces.
Keywords :
nonlinear optics; optical multilayers; silicon compounds; bulk silica; multilayered silicate thin films; second order optical nonlinearity; spatial profile; thermally poled; Anodes; Australia; Glass; Microscopy; Optical films; Optical surface waves; Optical waveguides; Silicon compounds; Spatial resolution; Transistors;
Conference_Titel :
Opto-Electronics and Communications Conference, 2008 and the 2008 Australian Conference on Optical Fibre Technology. OECC/ACOFT 2008. Joint conference of the
Conference_Location :
Sydney
Print_ISBN :
978-0-85825-807-5
Electronic_ISBN :
978-0-85825-807-5
DOI :
10.1109/OECCACOFT.2008.4610559
