Implementing the ATML Test Station and Test Adapter standards

The ATML family of standards have now been published through the IEEE and are beginning to be implemented in the test industry. This paper explores two of these ATML standards, the IEEE Std 1671.6 ATML Test Station Description and the IEEE Std 1671.5 ATML Test Adapter Description. These standards describe a test station and test adapter in an electronic format adhering to the XML standard. A description of the standards will be provided along with some suggestions on applications that could benefit from their incorporation. Some of the applications that will be explored are: test diagram generation, test station capability comparisons, test adapter fabrication, resource management and path allocation. In addition the ATML WireLists schema will be discussed, which is associated with the ATML Test Station and Test Adapter standards. This paper hopes to encourage the use of these standards by providing some guidance and resource materials to assist in their implementations.