• DocumentCode
    2725396
  • Title

    The use of ATML in managing TPS developments and life cycle maintenance

  • Author

    Gorringe, Chris

  • Author_Institution
    EADS Test Eng. Services (UK) Ltd., Wimborne, UK
  • fYear
    2010
  • fDate
    13-16 Sept. 2010
  • Firstpage
    2
  • Lastpage
    6
  • Abstract
    The paper considers the benefits and practicalities of using the Automatic Test Markup Language (ATML) family of Standards in Test Program Set (TPS) development and life cycle maintenance. As part of any TPS development, the exchange of critical information is key to the successful development of a TPS. At a project management level, these manifest themselves at key milestones in a development projects life (e.g. Requirements Specification, Preliminary Design review (PDR), Critical Design Review (CDR), Test Readiness Review (TRR), Final Design Review (FDR)) where specific information needs to transferred and validated. The use of ATML standards, such as UUT Description Test Description and Test Station, provide a standard way to exchange this information in a format suitable for analyses and tool support. The ability to validate this information at these key times in a program considerably improves the program management process and significantly controls the TPS development overspend by reducing changes and unforeseen requirements. The use of ATML allows this information to be transferred in a consistent manner rather than the more traditional documentation, which is more readily susceptible to mistakes and anomalies.
  • Keywords
    XML; automatic test software; program testing; program verification; software maintenance; software management; system documentation; ATML standard; TPS development management; automatic test markup language; life cycle maintenance; program management process; program validation; project management; test program set; Book reviews; Connectors; Documentation; Fault diagnosis; IEEE standards; Libraries; XML; ATML; CDR; Life-Cycle; PDR; TPS; Test Programming Set;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 2010 IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4244-7960-3
  • Type

    conf

  • DOI
    10.1109/AUTEST.2010.5613577
  • Filename
    5613577