DocumentCode
2725396
Title
The use of ATML in managing TPS developments and life cycle maintenance
Author
Gorringe, Chris
Author_Institution
EADS Test Eng. Services (UK) Ltd., Wimborne, UK
fYear
2010
fDate
13-16 Sept. 2010
Firstpage
2
Lastpage
6
Abstract
The paper considers the benefits and practicalities of using the Automatic Test Markup Language (ATML) family of Standards in Test Program Set (TPS) development and life cycle maintenance. As part of any TPS development, the exchange of critical information is key to the successful development of a TPS. At a project management level, these manifest themselves at key milestones in a development projects life (e.g. Requirements Specification, Preliminary Design review (PDR), Critical Design Review (CDR), Test Readiness Review (TRR), Final Design Review (FDR)) where specific information needs to transferred and validated. The use of ATML standards, such as UUT Description Test Description and Test Station, provide a standard way to exchange this information in a format suitable for analyses and tool support. The ability to validate this information at these key times in a program considerably improves the program management process and significantly controls the TPS development overspend by reducing changes and unforeseen requirements. The use of ATML allows this information to be transferred in a consistent manner rather than the more traditional documentation, which is more readily susceptible to mistakes and anomalies.
Keywords
XML; automatic test software; program testing; program verification; software maintenance; software management; system documentation; ATML standard; TPS development management; automatic test markup language; life cycle maintenance; program management process; program validation; project management; test program set; Book reviews; Connectors; Documentation; Fault diagnosis; IEEE standards; Libraries; XML; ATML; CDR; Life-Cycle; PDR; TPS; Test Programming Set;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON, 2010 IEEE
Conference_Location
Orlando, FL
ISSN
1088-7725
Print_ISBN
978-1-4244-7960-3
Type
conf
DOI
10.1109/AUTEST.2010.5613577
Filename
5613577
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