Title :
Fiber-top atomic force microscope: A worthwhile challenge
Author :
Smith, K. ; de Man, S. ; Zeijlemaker, H. ; Said, A.A. ; Dugan, M. ; Iannuzzi, D.
Author_Institution :
Vrije Univ. Amsterdam, Amsterdam
Abstract :
Fiber-top technology offers an unprecedented opportunity to bring atomic force microscopy outside research laboratories. In this paper we analyze the challenges this technology-transfer process is facing and we discuss why it is worth addressing them.
Keywords :
atomic force microscopy; fibre optic sensors; fiber-top atomic force microscope; fiber-top cantilever; technology-transfer process; Atomic force microscopy; Atomic measurements; Fiber lasers; Laboratories; Optical coupling; Optical fiber couplers; Optical fiber devices; Optical fibers; Optical interferometry; Photodiodes;
Conference_Titel :
Opto-Electronics and Communications Conference, 2008 and the 2008 Australian Conference on Optical Fibre Technology. OECC/ACOFT 2008. Joint conference of the
Conference_Location :
Sydney
Print_ISBN :
978-0-85825-807-5
Electronic_ISBN :
978-0-85825-807-5
DOI :
10.1109/OECCACOFT.2008.4610573
