Title :
Frequency synthesizer testing under vibration and temperature
Author :
Spiegel, Jeff N.
Author_Institution :
Electr. & Comput. Eng. Dept., Univ. of Utah, Salt Lake City, UT, USA
Abstract :
Particular problems can occur for frequency synthesizers under vibration and temperature. These effects will be outlined for providing margin to prevent failures. Phase noise, noise figure, and spectrum analysis tools are applied with vibration tables and thermal chambers. Particular focus is given to frequency synthesizers whose oscillators are most susceptible to environmental effects.
Keywords :
dynamic testing; frequency synthesizers; phase locked loops; phase noise; temperature measurement; environmental effects; frequency synthesizer testing; noise figure; oscillators; phase locked loop; phase noise; spectrum analysis tools; temperature measurement; thermal chambers; vibration tables; vibration testing; Bandwidth; Phase locked loops; Phase noise; Sensitivity; Vibrations; Voltage-controlled oscillators; automatic test equipment; automatic testing; interference suppression; low-frequency noise; phase noise; phase-locked loops (PLLs); radio frequency (RF) measurements; temperature measurement; vibrations;
Conference_Titel :
AUTOTESTCON, 2010 IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4244-7960-3
DOI :
10.1109/AUTEST.2010.5613578
