DocumentCode :
2725420
Title :
Implementing a high performance digital sub-system using the PXI architecture
Author :
Manor, David
Author_Institution :
Geotest - Marvin Test Syst., Irvine, CA, USA
fYear :
2010
fDate :
13-16 Sept. 2010
Firstpage :
1
Lastpage :
4
Abstract :
High Performance digital subsystems have been developed over the years using a variety of proprietary and industry standard architectures such as GPIB and VXI. With the availability of high performance / high density FPGAs and analog electronics, the implementation of high performance digital functional test subsystems has now become a reality using the PXI architecture. The smaller form factor of PXI, which offers users the ability to down size and deploy very cost effective, performance digital subsystems, has also presented some unique challenges for instrument design teams developing these high performance digital subsystems. This paper discusses some major considerations and challenges when implementing high performance digital instrumentation based on the PXI architecture.
Keywords :
automatic testing; computerised instrumentation; digital instrumentation; peripheral interfaces; GPIB; PXI architecture; VXI; analog electronics; high density FPGA; high performance FPGA; high performance digital functional test subsystem; high performance digital instrumentation; instrument design; Computer architecture; Connectors; Consumer electronics; Instruments; Power dissipation; Power supplies; Rails; PXI digital subystem; depot test; digital test; intermediate level test;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON, 2010 IEEE
Conference_Location :
Orlando, FL
ISSN :
1088-7725
Print_ISBN :
978-1-4244-7960-3
Type :
conf
DOI :
10.1109/AUTEST.2010.5613579
Filename :
5613579
Link To Document :
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