Title :
Microwave data link system testing
Author :
Spiegel, Jeff N.
Author_Institution :
Electr. & Comput. Eng. Dept., Univ. of Utah, Salt Lake City, UT, USA
Abstract :
System integration testing (SIT) is still relied upon for final confirmation of data link products. SIT, a costly process, is still required for most circuit card sub-assemblies because of the risk that lower level testing is either insufficient or incomplete. A description of production testing and debug is presented.
Keywords :
antenna testing; printed circuit testing; production testing; SIT; circuit card subassembly; data link product; lower level testing; microwave data link system testing; production testing; system integration testing; Attenuators; Phase locked loops; Phase noise; Radio frequency; Testing; automatic test equipment; automatic testing; environmental testing; interference suppression; low-frequency noise; manufacturing testing; phase noise; phase-locked loops (PLLs); radio frequency (RF) measurements; vibrations;
Conference_Titel :
AUTOTESTCON, 2010 IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4244-7960-3
DOI :
10.1109/AUTEST.2010.5613586
