DocumentCode :
2725610
Title :
Study of Static Dielectrtc Constant Of Doped Semiconductors By Measuring Electronic Transitions In The Far Infrared
Author :
Pradhan, M.M. ; Garg, R.K. ; Arora, Manu
Author_Institution :
National Physical Laboratory
fYear :
1990
fDate :
18-22 June 1990
Firstpage :
45
Lastpage :
48
Keywords :
Dielectric constant; Dielectric measurements; Effective mass; Electric variables measurement; Fourier transforms; Frequency measurement; Infrared spectra; Oscillators; Silicon; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Millimeter Wave and Far-Infrared Technology, 1990. ICMWFT '90. International Conference on
Conference_Location :
Beijing, China
Type :
conf
DOI :
10.1109/ICMWFT.1990.711406
Filename :
711406
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2725610
بازگشت