Title :
VDATS establishes common approach to ATE calibration
Author_Institution :
581st Software Maintenance Squadron, United States Air Force, Robins AFB, GA, USA
Abstract :
Two System Test Program Sets (TPS), Digital-Analog (DA) and Radio Frequency (RF) Calibration for the Versatile Depot Automatic Test Station (VDATS) were developed to semi-automate the process of Automated Test Equipment (ATE) calibration. Calibration for ATE in the U.S. Air Force (USAF) is defined as the verification of instrumentation accuracy by comparing the instrument to a known standard. The parametric envelopes are authorized by the Air Force Metrology and Calibration (AFMETCAL) Program Office in the form of the Calibration Measurement Requirement Summary (CMRS) which translate to all of VDATS performance specifications. The CMRS covers VDATS fundamental features and accuracies that are necessary to support Line Replaceable Units (LRUs) or Shop Replaceable Units (SRUs) weapon system testing mission. This paper presents an overview of the software and hardware implementation of the TPS. These are the first and foremost VDATS TPS to utilize the core VDATS System Software (e.g. Automated Test Equipment Graphical User Interface (ATEGUI), Instrument Wrappers, National Instruments LabWindows™/CVI), which are the main requirements for all TPS development hosted onto VDATS. The hardware associated with the calibration TPS includes the Portable Automatic Test Equipment Calibrator (PATEC), PATEC Augmentation (PA-1), Calibration Interface Test Adapter (CAL-ITA), and calibration kits. Since the CMRS for VDATS power supplies and electronic loads require standards outside of the PATEC Core capabilities, a need for the customized rack, PA-1, emerged and will be discussed in this paper.
Keywords :
automatic test equipment; calibration; military equipment; portable instruments; weapons; ATE calibration; CAL-ITA; PATEC augmentation; U.S. air force; VDATS power supplies; VDATS system software; air force metrology and calibration program office; calibration interface test adapter; calibration measurement requirement summary; digital-analog calibration; line replaceable unit; portable automatic test equipment calibrator; radio frequency calibration; shop replaceable unit; test program set; versatile depot automatic test station; weapon system testing mission; Accuracy; Calibration; Hardware; Instruments; Radio frequency; Software; Standards; ATE calibration; PATEC; TPS; VDATS;
Conference_Titel :
AUTOTESTCON, 2010 IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4244-7960-3
DOI :
10.1109/AUTEST.2010.5613590