DocumentCode :
2725647
Title :
Aspects of scaling to mesoscale models derived from the molecular scale for understanding epoxy interfaces
Author :
Iwamoto, Nancy
Author_Institution :
Honeywell Performance Materials and Technologies
fYear :
2012
fDate :
May 29 2012-June 1 2012
Firstpage :
1774
Lastpage :
1780
Abstract :
Model scaling from the atomistic level up in order to address performance issues is a topic of increasing interest. One type of scaling that is being investigated is a jump from the molecular scale (angstrom scale) to the submicron mesoscale model. Since both are particle methods, the scaling is a simple one of re-definition and re-parameterization of the particle interaction. This paper will cover aspects of the parameterization that we have found to be useful to allow scaling to the mesoscale and the subsequent mechanical response of the copper/epoxy adhesive interface, of practical interest in molding compounds. The maximum scaling achieved has been from the nanometer to submicron scales for an epoxy (increasing the formula weight in the crosslinked epoxy model by a factor of 500-1000). Obtaining larger models is possible with size limitations due to the computer resources available. Investigations in handling mesoscale models to address interface density, crosslinking effects, and roughness will be discussed.
Keywords :
adhesion; adhesives; copper; moulding; resins; scaling phenomena; Cu; address interface density; angstrom scale; atomistic level up; computer resources; copper/epoxy adhesive interface; crosslinked epoxy; crosslinking effects; model scaling; molding compounds; molecular scale; parameterization; particle interaction; particle methods; submicron mesoscale model; subsequent mechanical response; Computational modeling; Copper; Deformable models; Dielectrics; Plastics; Strain;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd
Conference_Location :
San Diego, CA
ISSN :
0569-5503
Print_ISBN :
978-1-4673-1966-9
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2012.6249078
Filename :
6249078
Link To Document :
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