DocumentCode :
2725723
Title :
Integrated diagnostic/prognostic experimental setup for capacitor degradation and health monitoring
Author :
Kulkarni, Chetan ; Biswas, Gautam ; Koutsoukos, Xenofon ; Celaya, Jose ; Goebel, Kai
Author_Institution :
Dept. of EECS, Vanderbilt Univ., Nashville, TN, USA
fYear :
2010
fDate :
13-16 Sept. 2010
Firstpage :
1
Lastpage :
7
Abstract :
This paper proposes the experiments and setups for studying diagnosis and prognosis of electrolytic capacitors in DC-DC power converters. Electrolytic capacitors and power MOS-FET´s have higher failure rates than other components in DC-DC converter systems. Currently, our work focuses on experimental analysis and modeling electrolytic capacitors degradation and its effects on the output of DC-DC converter systems. The output degradation is typically measured by the increase in Equivalent series resistance and decrease in capacitance leading to output ripple currents. Typically, the ripple current effects dominate, and they can have adverse effects on downstream components. A model based approach to studying degradation phenomena enables us to combine the physics based modeling of the DC-DC converter with physics of failure models of capacitor degradation, and predict using stochastic simulation methods how system performance deteriorates with time. Degradation experiments were conducted where electrolytic capacitors were subjected to electrical and thermal stress to accelerate the aging of the system. This more systematic analysis may provide a more general and accurate method for computing the remaining useful life (RUL) of the component and the converter system.
Keywords :
DC-DC power convertors; ageing; condition monitoring; electrolytic capacitors; failure analysis; power MOSFET; stochastic processes; thermal stresses; DC- DC power converters; adverse effects; aging; capacitance leading; capacitor degradation; electrical stress; electrolytic capacitors; equivalent series resistance; health monitoring; power MOSFET; stochastic simulation methods; thermal stress; Capacitance; Capacitors; Converters; Degradation; Hardware; Stress; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON, 2010 IEEE
Conference_Location :
Orlando, FL
ISSN :
1088-7725
Print_ISBN :
978-1-4244-7960-3
Type :
conf
DOI :
10.1109/AUTEST.2010.5613596
Filename :
5613596
Link To Document :
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