Title :
The case for embedded diagnostics used in conjunction with field test equipment
Author :
Westphalen, Jim ; Barton, Paul ; Tatem, Joe
Author_Institution :
Raytheon Network Centric Systems
Abstract :
Paper not available at time of production
Keywords :
Production; Test equipment;
Conference_Titel :
AUTOTESTCON, 2010 IEEE
Conference_Location :
Orlando, FL, USA
Print_ISBN :
978-1-4244-7960-3
DOI :
10.1109/AUTEST.2010.5613597
