• DocumentCode
    2725734
  • Title

    The case for embedded diagnostics used in conjunction with field test equipment

  • Author

    Westphalen, Jim ; Barton, Paul ; Tatem, Joe

  • Author_Institution
    Raytheon Network Centric Systems
  • fYear
    2010
  • fDate
    13-16 Sept. 2010
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Paper not available at time of production
  • Keywords
    Production; Test equipment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 2010 IEEE
  • Conference_Location
    Orlando, FL, USA
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4244-7960-3
  • Type

    conf

  • DOI
    10.1109/AUTEST.2010.5613597
  • Filename
    5613597
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2725734