DocumentCode
2725784
Title
Maximizing the measurement accuracy of digitized signals
Author
Haney, Mike
Author_Institution
Syst. Test Group, Teradyne, Inc., North Reading, MA, USA
fYear
2010
fDate
13-16 Sept. 2010
Firstpage
1
Lastpage
6
Abstract
Analysis of digitized waveforms requires an understanding of the limitations of the acquisition hardware, an understanding of how digital sampling interacts with the waveform shape, and an understanding of how the desired measurements are influenced by the sampling operation. By paying attention to these considerations and following some general guidelines an acquisition system can be tuned to get the most accurate results for each type of measurement. This paper provides guidelines for obtaining the best measurement results for digitized waveforms by highlighting the interactions between the waveform to be acquired, the acquisition system capturing the waveform, and the measurements desired.
Keywords
data acquisition; signal detection; signal sampling; waveform analysis; acquisition hardware; acquisition system; digital sampling; digitized signal; digitized waveform analysis; measurement accuracy; Accuracy; Algorithm design and analysis; Hardware; Image edge detection; Instruments; Noise; Voltage measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON, 2010 IEEE
Conference_Location
Orlando, FL
ISSN
1088-7725
Print_ISBN
978-1-4244-7960-3
Type
conf
DOI
10.1109/AUTEST.2010.5613600
Filename
5613600
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