• DocumentCode
    2725784
  • Title

    Maximizing the measurement accuracy of digitized signals

  • Author

    Haney, Mike

  • Author_Institution
    Syst. Test Group, Teradyne, Inc., North Reading, MA, USA
  • fYear
    2010
  • fDate
    13-16 Sept. 2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Analysis of digitized waveforms requires an understanding of the limitations of the acquisition hardware, an understanding of how digital sampling interacts with the waveform shape, and an understanding of how the desired measurements are influenced by the sampling operation. By paying attention to these considerations and following some general guidelines an acquisition system can be tuned to get the most accurate results for each type of measurement. This paper provides guidelines for obtaining the best measurement results for digitized waveforms by highlighting the interactions between the waveform to be acquired, the acquisition system capturing the waveform, and the measurements desired.
  • Keywords
    data acquisition; signal detection; signal sampling; waveform analysis; acquisition hardware; acquisition system; digital sampling; digitized signal; digitized waveform analysis; measurement accuracy; Accuracy; Algorithm design and analysis; Hardware; Image edge detection; Instruments; Noise; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 2010 IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4244-7960-3
  • Type

    conf

  • DOI
    10.1109/AUTEST.2010.5613600
  • Filename
    5613600