Efficient parametric modeling and analysis for backplane channel characterization

Author

Gu, Xiaoxiong ; Han, Ki Jin ; Cracraft, Michael ; Donadio, Renato Rimolo ; Kwark, Young

Author_Institution

IBM T. J. Watson Res. Center, Yorktown Heights, NY, USA

fYear

2012

fDate

May 29 2012-June 1 2012

Firstpage

1880

Lastpage

1885

Abstract

This paper presents the applications of a statistical and parametric link simulation environment (SPLSE) in modeling and characterizing server backplane channels. Model-to-hardware correlation is demonstrated for a 15-inch 3 Gb/s single-ended channel and an 18-inch 12 Gb/s differential channel, respectively. Hardware validated equalization schemes are further applied to demonstrate error free NRZ signaling at 25 Gb/s for the rehabilitated 18-inch differential channel with a lower-loss dielectric material.

Keywords

dielectric materials; integrated circuit modelling; backplane channel characterization; bit rate 12 Gbit/s; bit rate 25 Gbit/s; bit rate 3 Gbit/s; differential channel; error free NRZ signaling; hardware validated equalization schemes; lower-loss dielectric material; model-to-hardware correlation; parametric link simulation; parametric modeling; server backplane channels; single-ended channel; size 15 in; size 18 in; statistical link simulation; Backplanes; Computational modeling; Connectors; Copper; Correlation; Integrated circuit modeling; Scattering parameters;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd

Conference_Location

San Diego, CA

ISSN

0569-5503

Print_ISBN

978-1-4673-1966-9

Electronic_ISBN

0569-5503

Type

conf

DOI

10.1109/ECTC.2012.6249094

Filename

6249094