• DocumentCode
    2726072
  • Title

    Genetic Techniques for Pattern Extraction in Particle Boards Images

  • Author

    Gamassi, Marco ; Piuri, Vincenzo ; Scotti, Fabio ; Roveri, Manuel

  • Author_Institution
    Dept. of Inf. Technol., Milan Univ.
  • fYear
    2006
  • fDate
    12-14 July 2006
  • Firstpage
    129
  • Lastpage
    134
  • Abstract
    Time-to-market and high product quality standards are pushing the use of automatic visual inspection systems for defect detection in a wide broad of applications. The defect detection of particle boards requires the identification of all the printed and natural wood defects that can occur. The availability of information about the particle board to inspect (e.g. the pattern used to print the surface of the board) could increase heavily the defect detection capability of a quality assessment system. Nevertheless, most of the times the pattern is not available during the defect detection phase (i.e. when the pattern changes quickly or when printing and defect detection are not performed by the same company). We propose a novel approach for pattern extraction based on genetic techniques to identify the printing pattern that can be used in defect classification systems. Experimental results show the valuable pattern extraction capabilities of the proposed approach
  • Keywords
    feature extraction; image classification; production engineering computing; production materials; quality control; wood; defect classification system; genetic technique; natural wood defect; particle boards images; pattern extraction; printed wood defect; printing pattern; product quality standard; quality assessment system; quality control; surface defects detection; surface quality assessment; visual inspection system; Computational intelligence; Data mining; Genetics; Inspection; Particle measurements; Phase detection; Plastics; Printing; Production facilities; Switches; Particle Boards; Pattern Extraction; Quality Control; Surface Defects Detection; Surface Quality Assessement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Intelligence for Measurement Systems and Applications, Proceedings of 2006 IEEE International Conference on
  • Conference_Location
    La Coruna
  • Print_ISBN
    1-4244-0244-1
  • Electronic_ISBN
    1-4244-0245-X
  • Type

    conf

  • DOI
    10.1109/CIMSA.2006.250761
  • Filename
    4016843