• DocumentCode
    2726153
  • Title

    ESD improvements for familiar automated handlers

  • Author

    Bernier, Joe ; Hesher, Bruce

  • Author_Institution
    Harris Semicond., Melbourne, FL, USA
  • fYear
    1995
  • fDate
    12-14 Sept. 1995
  • Firstpage
    110
  • Lastpage
    117
  • Abstract
    Many older models of automated test handlers still in common usage were not designed with static prevention in mind and can present a severe ESD hazard to sensitive devices. This paper presents a set of upgrades to materials and grounding techniques to minimize the static environment associated with specific handlers.
  • Keywords
    automatic test equipment; automatic testing; earthing; electrostatic discharge; integrated circuit testing; protection; ATE; ESD hazard; ESD improvements; automated handlers; grounding techniques; static prevention; test handlers; Automatic testing; Electrostatic discharge; Grounding; Hazards;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 1995
  • Conference_Location
    Phoenix, AZ, USA
  • Print_ISBN
    1-878303-59-7
  • Type

    conf

  • DOI
    10.1109/EOSESD.1995.478275
  • Filename
    478275
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2726153